Fuse-Based Field-Dispensable ESD Protection for Ultra-High-Speed ICs

201418 citationsJournal Article

Authors

Chen Zhang · University of California, Riverside

Zongyu Dong · University of California, Riverside

Fei Lu · University of California, Riverside

Rui Ma · University of California, Riverside

Li Wang · University of California, Riverside

Hui Zhao · Marvell (United States)

Xin Wang ·

Abstract

We report the first fuse-based field-dispensable electrostatic discharging (ESD) protection structure to eliminate the ESD-induced parasitics, hence, enable ultrahigh-speed ICs with robust ESD protection. Silicon results validate the new ESD protection concept for more than 20 Gb/s ICs in a 28-nm CMOS.

Topics & Keywords

Electrostatic Discharge in Electronics Integrated Circuits and Semiconductor Failure Analysis Semiconductor materials and devices

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: IEEE Electron Device Letters

Volume 35, Issue 3, pp. 381-383

DOI: 10.1109/led.2014.2300496

Field-Weighted Citation Impact: 2.34