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Fast Ion Induced Shearing of 2D Alfvén Eigenmodes Measured by Electron Cyclotron Emission Imaging
2011
105 citations
Journal Article
green Open Access
Field-Weighted Citation Impact:
19.48
Fast Ion Induced Shearing of 2D Alfvén Eigenmodes Measured by Electron Cyclotron Emission Imaging | Researchclopedia
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Pohang University of Science and Technology
D. A. Spong
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Oak Ridge National Laboratory
M. A. Van Zeeland
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General Atomics (United States)