Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN

In the period October 21 – 28, 2015, the CMS HCAL group did a radiation tolerance study for the Phase I Upgrade HF, HE and HB front end electronics. The test was conducted at the CERN CHARM facility, which is a mixed field radiation facility. No permanent damages were observed. Effects observed during the irradiation are presented.