Analysis of Al₂O₃—parylene C bilayer coatings and impact of microelectrode topography on long term stability of implantable neural arrays

We observed encapsulation failure modes and behaviors comparable to neural electrode performance which were undetected in studies with planar test devices. We found the impact of parylene C defects to be exacerbated by ALD Al₂O₃, and conclude that inferior bilayer performance arises from degradation of ALD Al₂O₃ when directly exposed to saline. This is an important consideration, given that neural electrodes with bilayer coatings are expected to have ALD Al₂O₃ exposed at dielectric boundaries that delineate electrode sites. Process improvements and use of different inorganic coatings to decrease dissolution in physiological fluids may improve performance. Testing frameworks which take neural electrode complexities into account will be well suited to reliably evaluate such encapsulation schemes.