Researchclopedia

Research Researchers Institutions Topics Submit About

Command Palette

Search for a command to run...

Researchclopedia

Research Researchers Institutions About

© 2026 Researchclopedia. Powered by OpenAlex under CC0 license.

Back to research

Built-in test for VLSI — pseudorandom techniques

1989639 citationsJournal Article

Authors

Colin Maunder · BT Group (United Kingdom)

Topics & Keywords

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Electrostatic Discharge in Electronics

Publication Details

Published in: Microprocessors and Microsystems

Volume 13, Issue 1, pp. 62-62

DOI: 10.1016/0141-9331(89)90036-7

Field-Weighted Citation Impact: 12.47

Built-in test for VLSI — pseudorandom techniques | Researchclopedia