Elaboration of a new pulsed laser system for SEE testing

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Authors

V. Pouget · Laboratoire de l'Intégration du Matériau au Système

T. Calin · Techniques of Informatics and Microelectronics for Integrated Systems Architecture

H. Lapuyade · Laboratoire de l'Intégration du Matériau au Système

David Lewis · Laboratoire de l'Intégration du Matériau au Système

P. Fouillat · Laboratoire de l'Intégration du Matériau au Système

Raoul Velazco · Techniques of Informatics and Microelectronics for Integrated Systems Architecture

Abstract

This paper presents the elaboration of a new on-line single event effects testing facility based on a pulsed laser. Experimental choices and capabilities are detailed. Preliminary results confirm that the pulsed laser technique is a powerful complement for irradiation testing.

Topics & Keywords

Radiation Effects in Electronics Integrated Circuits and Semiconductor Failure Analysis Radiation Detection and Scintillator Technologies

Publication Details

Published in: HAL (Le Centre pour la Communication Scientifique Directe)

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Elaboration of a new pulsed laser system for SEE testing

Authors

Abstract

Topics & Keywords

Publication Details