Analytical Solutions of Transient Drift-Diffusion in P-N Junction Pixel Sensors

Radiation detection in applications ranging from high energy physics to medical imaging rely on solid state detectors, often hybrid pixel detectors with (1) reverse biased p-n junction pixel sensors and (2) readout ASICs, attached by flipchip-bonding. Transient signals characteristics are important in, e.g., matching ASIC and sensor design, modeling and optimizing detector parameters and describing timing and charge sharing properties. Currently analytical forms of transient signals are available for only a few limited cases (e.g., drift or diffusion) or for the steady state (which is not relevant for high energy radiation detection). Tools are available for (relatively slow) numerical evaluation of the transient charge transport. We present here the first analytical solutions of partial differential equations describing drift-diffusion-recombination charge transport in planar p-n junction sensors in a variety of conditions: (1) undepleted, (2) fully depleted, (3) taking into account the gradual velocity saturation, and (4) overdepleted. We deduce the Green's functions which can be applied to any detection problem through simple convolution with the initial conditions. We compare the analytical solutions with Monte Carlo simulations and industry standard simulations (Synopsys Sentaurus), demonstrating good agreement. Using the analytical equations enables fast modeling of the influence of various detector parameters on tracking, imaging and timing performance, describing performance and enabling optimizations for different applications. Finally, we illustrate this model with applications in 3D+T (x,y,z,time) photon tracking and 4D+T (x,y,,,time) relativistic charged particle tracking.