RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions

201895 citationsJournal Article

Authors

Р. С. Бубнова · Institute of Chemistry of Silicates named after I.V. Grebenshchikov

Vera A. Firsova · Institute of Chemistry of Silicates named after I.V. Grebenshchikov

Sergey N. Volkov · Institute of Chemistry of Silicates named after I.V. Grebenshchikov

С. К. Филатов · St Petersburg University

Abstract

The RietveldToTensor program is designed to study crystal lattice deformations using the Rietveld method from the X-ray powder diffraction data gathered under varying physical and chemical conditions. Using the program, it is possible to determine the tensor of thermal expansion, compressibility, or chemical deformations of the material. The program runs on the Microsoft Windows 7 and higher platforms.

Topics & Keywords

X-ray Diffraction in Crystallography High-pressure geophysics and materials Thermal and Kinetic Analysis

Publication Details

Published in: Glass Physics and Chemistry

Volume 44, Issue 1, pp. 33-40

DOI: 10.1134/s1087659618010054

Field-Weighted Citation Impact: 3.47

Command Palette

RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions

Authors

Abstract

Topics & Keywords

Publication Details