Irreversible degradation of Nb₃Sn Rutherford cables due to transverse compressive stress at room temperature

In the framework of the Future Circular Collider design study for a 100 TeV circular collider, 16 T superconducting bending magnets based on Nb$_3$Sn technology are being developed. A pre-stress on the conductor during magnet assembly at room temperature (RT) is needed to counteract the Lorentz forces during operation. The superconducting properties of the brittle Nb$_3$Sn superconductor are strain sensitive and excessive pre-stress leads to an irreversible degradation of the superconductor. In order to determine the level of acceptable pre-stress during the magnet assembly process, reacted and impregnated Nb$_3$Sn cables were exposed to increasing transverse compressive stress up to a maximum stress level of 200 MPa at RT. After each stress cycle, the critical current of the cable specimens were characterized at 4.3 K in the FRESCA cable test station. No significant critical current degradation was observed up to 150 MPa, followed by degradation less than 4% after a nominal stress of 175 MPa. A dramatic permanent critical current degradation occurred after applying a nominal stress of 200 MPa. A comprehensive post analysis consisting of non-destructive micro-tomography followed by microscopic characterization of metallographic cable cross sections was carried out after the critical current test to reveal cracks in the Nb$_3$Sn sub-elements of the loaded specimen.