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Testing semiconductor memories, theory and practice

1992514 citationsJournal Article

Authors

Topics & Keywords

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Engineering and Test Systems

UN Sustainable Development Goals

Sustainable cities and communities

Publication Details

Published in: Microprocessors and Microsystems

Volume 16, Issue 7, pp. 388-389

DOI: 10.1016/0141-9331(92)90016-m

Field-Weighted Citation Impact: 3.79

Testing semiconductor memories, theory and practice | Researchclopedia