Characterization and Correction of Multispectral Resolving Filter-On-Chip CMOS-Sensor-Systems for Shape, Color and Composition Measurements

Abstract Aim of the paper is to show which increased capabilities are offered by the application of multispectral resolving Filter-On-Chip CMOS-Sensor-Systems for shape, color and spectral measurements. The paper will show a generalized method how these new Sensor-Systems can be characterized through measurements and how they can be applied for selected measurement tasks where the parallel acquisition of shapes, colors and compositions matters. Furthermore, it will be shown how an extended system characterization for multispectral resolving Filter-On-Chip CMOS-Sensor-Systems can be realized methodically to determine sensor-system caused systematic deviations influenced by illumination, optics, multispectral filter matrices and the CMOS-Sensors itself and how the results can be used for the algorithmically correction to overcome the sensor-system caused systematic deviations.