Secondary Fluorescence Correction for Quantitative X-ray Microanalysis Integrated in a User-Friendly Framework

Journal Article Secondary Fluorescence Correction for Quantitative X-ray Microanalysis Integrated in a User-Friendly Framework Get access Yu Yuan, Yu Yuan McGill University, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Hendrix Demers, Hendrix Demers Centre d'excellence en électrification des transports et stockage d’énergie, Hydro-Québec, Varennes, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Samantha Rudinsky, Samantha Rudinsky Steam Instruments, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Nicolas Brodusch, Nicolas Brodusch McGill University, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Mathieu Gendron, Mathieu Gendron Object Research Systems, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Eric Yen, Eric Yen Object Research Systems, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Sabrina Clusiau, Sabrina Clusiau Object Research Systems, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Nicolas Piché, Nicolas Piché Object Research Systems, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Raynald Gauvin Raynald Gauvin McGill University, Montreal, Quebec, Canada Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 500–502, https://doi.org/10.1017/S1431927620014865 Published: 01 August 2020