Synchrotron X-ray quantitative evaluation of transient deformation and damage phenomena in a single nickel-rich cathode particle

202087 citationsJournal Articlehybrid Open Access

Authors

León Romano Brandt · Oxfam

John‐Joseph Marie · University of Oxford

Thomas Moxham · Oxfam

Dominic P. Förstermann · University of Oxford

Enrico Salvati · Oxfam

Cyril Besnard · Oxfam

Chrysanthi Papadaki · Oxfam

Abstract

<italic>Operando</italic> synchrotron XRD and <italic>in situ</italic> ptycho-tomography of single NMC811 particle revealed the correlation between lattice strain and degradation.

Topics & Keywords

Advancements in Battery Materials Semiconductor materials and devices Electron and X-Ray Spectroscopy Techniques

Publication Details

Published in: Energy & Environmental Science

Volume 13, Issue 10, pp. 3556-3566

DOI: 10.1039/d0ee02290j

Field-Weighted Citation Impact: 4.77

Command Palette

Synchrotron X-ray quantitative evaluation of transient deformation and damage phenomena in a single nickel-rich cathode particle

Authors

Abstract

Topics & Keywords

Publication Details