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The measurement of the dislocation density using TEM

202163 citationsJournal Article

Authors

Meng Yang · Shougang Institute of Technology

Xinhua Ju · Shougang Institute of Technology

Topics & Keywords

Advanced Electron Microscopy Techniques and Applications Integrated Circuits and Semiconductor Failure Analysis Electron and X-Ray Spectroscopy Techniques

UN Sustainable Development Goals

Decent work and economic growth

Publication Details

Published in: Materials Characterization

Volume 175, pp. 111065-111065

DOI: 10.1016/j.matchar.2021.111065

Field-Weighted Citation Impact: 4.35

The measurement of the dislocation density using TEM | Researchclopedia