Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples

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Authors

Yu Yuan

Sabrina Clusiau

Raynald Gauvin · McGill University

Christopher K. E. Bleck · National Heart Lung and Blood Institute

Adrian Phoulady · University of Connecticut

Pouya Tavousi · Park University

Sina Shahbazmohamadi · University of Connecticut

Nicolas Piché

Abstract

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Topics & Keywords

Electron and X-Ray Spectroscopy Techniques Advanced Electron Microscopy Techniques and Applications Integrated Circuits and Semiconductor Failure Analysis

Publication Details

Published in: Microscopy and Microanalysis

Volume 27, Issue S1, pp. 776-777

DOI: 10.1017/s1431927621003093

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Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples

Authors

Abstract

Topics & Keywords

Publication Details