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Study of local strip errors in silicon sensors for the CMS experiment

20040 citationsJournal Article

Authors

S. Freudenstein

Fabian Hartmann

P. Steck · Karlsruhe Institute of Technology

Topics & Keywords

Particle Detector Development and Performance CCD and CMOS Imaging Sensors Advanced MEMS and NEMS Technologies

Publication Details

Published in: Verhandlungen der Deutschen Physikalischen Gesellschaft

Volume 39, Issue 6, pp. 27

Field-Weighted Citation Impact: 0.00

Study of local strip errors in silicon sensors for the CMS experiment | Researchclopedia