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Scanning Electron Microscopy and X-Ray Microanalysis

19921,206 citationsBook

Authors

Joseph I. Goldstein · Lehigh University

Dale E. Newbury · National Institute of Standards and Technology

Patrick Echlin · University of Cambridge

David C. Joy · University of Tennessee at Knoxville

A. D. Romig · Sandia National Laboratories

Charles E. Lyman · Lehigh University

Charles E. Fiori

Topics & Keywords

Electron and X-Ray Spectroscopy Techniques Advanced Materials Characterization Techniques Machine Learning in Materials Science

Publication Details

DOI: 10.1007/978-1-4613-0491-3

Field-Weighted Citation Impact: 4.80

Scanning Electron Microscopy and X-Ray Microanalysis | Researchclopedia

· National Institute of Standards and Technology

Eric Lifshin · General Electric (United States)