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Characterization of Radiation Damage by Transmission Electron Microscopy

2001182 citationsBook

Authors

Marquis A. Kirk

Topics & Keywords

Integrated Circuits and Semiconductor Failure Analysis Silicon and Solar Cell Technologies

Publication Details

DOI: 10.1887/075030748x

Field-Weighted Citation Impact: 2.35

Characterization of Radiation Damage by Transmission Electron Microscopy | Researchclopedia