Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

200913 citationsJournal Article

Authors

Martha V. O'Bryan · MEI Technologies (United States)

Kenneth A. LaBel

Jonathan A. Pellish

S. Büchner · Global Strategy Group

Ray Ladbury

Timothy R. Oldham

Hak Kim · MEI Technologies (United States)

Michael J. Campola · MEI Technologies (United States)

Jean‐Marie Lauenstein

Abstract

We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

Topics & Keywords

Radiation Effects in Electronics Spacecraft Design and Technology Technology Assessment and Management

Publication Details

DOI: 10.1109/redw.2009.5336321

Field-Weighted Citation Impact: 1.79

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Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Authors

Abstract

Topics & Keywords

Publication Details