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Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy
2013
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Journal Article
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Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy | Researchclopedia
Thierry Épicier
·
Matériaux Ingénierie et Science