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Scanning Electron Microscopy and X-ray Microanalysis

20031,709 citationsBook

Authors

Joseph I. Goldstein · University of Massachusetts Amherst

Dale E. Newbury · National Institute of Standards and Technology

David C. Joy · University of Tennessee at Knoxville

Charles E. Lyman · Lehigh University

Eric Lifshin · University at Albany, State University of New York

Linda C. Sawyer

Joseph R. Michael

Topics & Keywords

Electron and X-Ray Spectroscopy Techniques Advanced Materials Characterization Techniques Machine Learning in Materials Science

Publication Details

DOI: 10.1007/978-1-4615-0215-9

Field-Weighted Citation Impact: 7.64

Scanning Electron Microscopy and X-ray Microanalysis | Researchclopedia

· Sandia National Laboratories