Sideband Peak Count – a new nonlinear ultrasonic technique for monitoring damage progression in engineering materials

Linear ultrasonic (LU) techniques used by majority of the researchers working in material damage monitoring, are reliable for detecting relatively large defects. If the defect dimensions are in the range of the ultrasonic wavelength or larger, then those defects can be detected by analyzing the scattered ultrasonic fields. Material damage affects LU parameters such as ultrasonic wave speed and attenuation and their changes are detectable for relatively large defects. However, for small defects (when defect dimensions are significantly smaller than the wavelength of the propagating signal) the changes in the LU parameters are too small to detect or measure reliably. For detecting small defects engineers often use high frequency ultrasonic signals to make the defect dimensions greater than the wavelength. However, high frequency signals attenuate quickly and therefore, only very small regions near the ultrasonic probe can be inspected in this manner. Inspecting large structures by high frequency ultrasonic signals requires moving the probe mechanically from one point to the next and therefore, can be very time consuming. Nonlinear ultrasonic (NLU) technique on the other hand does not need to satisfy this restricting condition that the wavelength of the signal must be smaller than the defect size. NLU works well when the signal wavelength is much larger than the defect size. Therefore, relatively low frequency signals that can propagate a long distance and monitor a large area of a structure can be used for NLU measurements. Different NLU techniques can be used for detection and monitoring of small damages in a specimen. A relatively new NLU technique called the Sideband Peak Count-Index or SPC-I technique has been developed by the author and his collaborators. SPC-I technique for monitoring different types of materials – composites, metals, concrete, and other cement-based materials has been found to be effective. Along with those success stories of SPC-I the effect of topography and the advantage of topological sensing is also discussed in this presentation.