Wideband Quantitative <i>S</i>-Parameter Extraction From FDTD Simulations With Power Consistency

This letter proposes a new method of <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S</i>-parameter extraction from finite-difference time-domain simulations for microwave devices with waveport. Different from the classical theory by Gwarek, the present method considers the frequency dependence of mode impedance and normalization by excitation waveform in the frequency domain. As a result, quantitative information of the incident wave and reflected wave in the frequency domain can be extracted. This can further provide a quantitative power perspective similar to the frequency domain method, in particular for evanescent mode. Hence, the new method has power consistency. Several numerical examples demonstrate the effectiveness and priority of the proposed method.