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Reliability assessment of SiC power MOSFETs in dynamic reverse bias test

20256 citationsJournal Article

Authors

Alessandro Sitta · STMicroelectronics (Switzerland)

Giuseppe Mauromicale · STMicroelectronics (Switzerland)

M. Fiore · STMicroelectronics (Switzerland)

Michele Calabretta · STMicroelectronics (Switzerland)

Topics & Keywords

Silicon Carbide Semiconductor Technologies Semiconductor materials and devices Electromagnetic Compatibility and Noise Suppression

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: Microelectronics Reliability

Volume 171, pp. 115770-115770

DOI: 10.1016/j.microrel.2025.115770

Field-Weighted Citation Impact: 4.39

Reliability assessment of SiC power MOSFETs in dynamic reverse bias test | Researchclopedia