Researchclopedia

Research Researchers Institutions Topics Submit About

Command Palette

Search for a command to run...

Researchclopedia

Research Researchers Institutions About

© 2026 Researchclopedia. Powered by OpenAlex under CC0 license.

Back to research

Advanced Characterization of Materials at the Nanoscale Using SIMS

20250 citationsJournal Article

Authors

Torsten Richter · Raith (Germany)

Alexander Øst · Raith (Germany)

Peter Gnauck · Raith (Germany)

Topics & Keywords

Ion-surface interactions and analysis Diamond and Carbon-based Materials Research Force Microscopy Techniques and Applications

Publication Details

Published in: Microscopy and Microanalysis

Volume 31, Issue Supplement_1

DOI: 10.1093/mam/ozaf048.004

Field-Weighted Citation Impact: 0.00

Advanced Characterization of Materials at the Nanoscale Using SIMS | Researchclopedia