Sub-THz PA EVM Measurements with Ultra-Wideband Test Signals

Active component testing at sub-THz frequencies relies on the pertinent choice of instruments, test signals and data processing algorithms as the dynamic range margins of instruments are drastically reduced. In the meantime, the modulation bandwidths and data flows are larger than ever, often reaching 100 Gigabits/s or more. VNA-based measurement setups are pushed to their limits to achieve state-of-the art power amplifier (PA) wideband stimulus-response measurements with sub 1 % EVM at 250 GHz carrier, 144 Gigabits/s.