White-Beam X-Ray Sectional Topography of Anthracene Single Crystals Grown by Physical Vapor Transport Technique

White-beam X-ray sectional topography enabled the successful evaluation of the quality of anthracene single crystals grown by the physical vapor transport technique; however, such single crystals exhibited a thin plateletlike configuration and their quality is difficult to evaluate in the cross-sectional direction. The experimental results showed that the anthracene single crystals grown by the physical vapor transport technique maintained their high quality; however, they tended to have widespread hollows inside owing to their specific configuration.