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Dynamic humidity testing of SiC power semiconductors | Researchclopedia

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Dynamic humidity testing of SiC power semiconductors

20260 citationsJournal Articlegreen Open Access

Authors

Yana Angelova · Infineon Technologies (Germany)

Uwe Stickelmann · Infineon Technologies (Germany)

Oliver Hoelbe · SMA Solar Technology (Germany)

Marc Tuellmann · Infineon Technologies (Germany)

Oliver Schilling · Infineon Technologies (Germany)

Paul Salmen · Infineon Technologies (Germany)

Topics & Keywords

Silicon Carbide Semiconductor Technologies Advanced ceramic materials synthesis Calibration and Measurement Techniques

Publication Details

Published in: Microelectronics Reliability

Volume 180, pp. 116119-116119

DOI: 10.1016/j.microrel.2026.116119

Field-Weighted Citation Impact: 0.00