Layer-Removal Correction for Diffraction Methods

Abstract This article proposes analytical correction methods to account for layer-removal effects on residual stresses measured using the XRD technique. The Moore and Evans corrections are undoubtedly the most widely used equations in the literature and industry measurements. Both approaches are proposed for various simple geometries. The article introduces early approaches using FEA before detailing the FEA matrix-relaxation correction method in its original form, proposed by Hornbach et al., and then in its improved form to better manage residual stress field gradients. It presents a brief overview of studies available in the literature and their key findings related to the layer-removal correction methods.