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Defects in SiO2 and Related Dielectrics: Science and Technology

2000483 citationsBook

Authors

Gianfranco Pacchioni · University of Milano-Bicocca

Linards Skuja · University of Latvia

David L. Griscom · United States Naval Research Laboratory

Topics & Keywords

Glass properties and applications

Publication Details

DOI: 10.1007/978-94-010-0944-7

Field-Weighted Citation Impact: 3.67

Defects in SiO2 and Related Dielectrics: Science and Technology | Researchclopedia