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Gate-to-source ESD protection design for GaN-on-silicon power HEMT

20251 citationsJournal Article

Authors

Chieh-Chen Ker · National Yang Ming Chiao Tung University

Chun-Yu Lin · National Yang Ming Chiao Tung University

Ming-Duo Ker · National Yang Ming Chiao Tung University

Yu-Hsuan Chang · United Microelectronics (Taiwan)

Ching-Wei Li · United Microelectronics (Taiwan)

Tsung-Yin Chiang · ELAN Microelectronics (Taiwan)

Chun-Chi Wang · ELAN Microelectronics (Taiwan)

Topics & Keywords

GaN-based semiconductor devices and materials Electrostatic Discharge in Electronics Silicon Carbide Semiconductor Technologies

Publication Details

Published in: Microelectronics Reliability

Volume 175, pp. 115948-115948

DOI: 10.1016/j.microrel.2025.115948

Field-Weighted Citation Impact: 1.27

Gate-to-source ESD protection design for GaN-on-silicon power HEMT | Researchclopedia