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Ion-beam-induced charge study of new 4H-SiC detectors for microdosimetry

20260 citationsJournal Article

Authors

Marcio Jiménez Venegas · Centro Nacional de Microelectrónica

Consuelo Guardiola · Centro Nacional de Microelectrónica

Giulio Pellegrini · Centro Nacional de Microelectrónica

Carmen Torres Muñoz · Centro Nacional de Aceleradores

Javier García López · Centro Nacional de Aceleradores

María del Carmen Jiménez-Ramos · Centro Nacional de Aceleradores

Philippe Godignon

Topics & Keywords

Silicon Carbide Semiconductor Technologies X-ray Spectroscopy and Fluorescence Analysis Diamond and Carbon-based Materials Research

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: Radiation Measurements

Volume 194, pp. 107660-107660

DOI: 10.1016/j.radmeas.2026.107660

Field-Weighted Citation Impact: 0.00

Ion-beam-induced charge study of new 4H-SiC detectors for microdosimetry | Researchclopedia

· Centro Nacional de Microelectrónica

C. Fleta · Centro Nacional de Microelectrónica