Analysis and Solution to Slew-Rate-Detection NAND ESD Clamp Failure in RF Front-End Module

The HBM failure of a slew-rate-detection ESD clamp in a RF front-end module is analyzed. Although HBM failed at low levels, TLP characterization did not display the same low- level failures. Transient ESD simulations were performed to understand the test discrepancy and investigate the failure mechanism. The off-chip bypass capacitor in the module was shown to stop the low-level HBM clamp turn-on.