Fingerprinting Uranium Oxides with Electron Energy Loss Spectroscopy Supported by Theoretical Computations

Uranium oxides occur in a variety of phases that differ in their crystal structure and uranium oxidation states. Electron energy loss spectroscopy (EELS) is one of the few techniques that has sufficient spatial resolution and sensitivity to electronic structure to distinguish among phases at the nanoscale. However, beam-sensitive materials, such as uranium oxides, are subject to spectral modification due to interactions with the electron beam. Therefore, theory support is essential to reliably exclude the impact of beam damage and generate true reference data sets. Here, we use a comparison of theoretical and experimental spectra to probe the impact of beam damage on the O <i>K</i>-edge and U <i>N</i>-edge (<i>N</i>_6,7 and <i>N</i>_4,5) EELS spectra of various single-valent and mixed-valence uranium oxide bulk phases. Using a low-dose experimental setup, we show that the <i>K</i>-edge theoretical spectra are in excellent agreement with experiment for both peak positions and relative intensities of respective peaks. In contrast, U <i>N</i>-edge features are less distinguishing due to the partially localized nature of the U 5f orbitals and overlapping multiplet and spin-orbit coupling effects. This work demonstrates that O <i>K</i>-edge EELS is sufficiently diagnostic to distinguish a wide range of uranium oxides and that the experimental approach used here minimizes beam damage and allows valence state discrimination across the U(IV), U(V), and U(VI) series. When combined with imaging modes available in electron microscopy, this work enables a detailed investigation and characterization of uranium redox transformations at the nanoscale.