Application of in-situ X-Ray diffraction characterization to reveal the mechanisms of superconducting thin films growth on industrial substrates by ultrafast Transient Liquid Assisted Growth method

With the development of a new method of growing epitaxial superconducting thick films of YBa2Cu3O7 (YBCO), Transient Liquid Assisted Growth (TLAG), came the possibility to fabricate High Temperature Superconductors (HTS) in an ultrafast and cost-effective manner, making them relevant for industrial applications. Nevertheless, the study of the mechanisms of this non-equilibrium process due to its fast kinetics is not possible by standard techniques and thus, requires more advanced approach. To obtain a deep understanding of the process, a close collaboration between ICMAB-CSIC and ALBA was established in the framework of the PTI+ TransEner project, co-founded by Next Generation EU funds. Within this collaboration, an experimental set-up was built allowing to study in-situ growth of superconducting films by TLAG at the NCD-SWEET. The key point of the setup is the combinatorial investigation of the TLAG process using synchrotron radiation and laboratory devices while growing superconducting epitaxial thin films. The setup consists of an X-ray transparent graphite dome of the customized hot stage, an accurate gas flow and pressure control, a mass spectrometer to monitor the gaseous products of the process and the possibility to measure the electrical conductivity of the sample throughout all the process. The installation allows to study the influence of the process parameters on epitaxial evolution, oxygen diffusion and growth rate on model substrates, such as strontium titanate (STO) and industrially relevant metallic tapes used for Coated Conductor´s fabrication in industry.