Comments on “Experimental Evaluation of Relationship Between Radiofrequency Heating Near Implanted Conductive Devices, Scanner-Reported B _1+rms , and Transmit Power”

In the above article [1] regarding heating near implanted conductive medical devices during MRI, key experimental conditions regarding “RF shimming” parameters are not identified. Therefore, the exact mechanism causing the spread in heating cannot be reliably identified. The likely mechanism is suggested here, and it is noted that the spread in heating results is expected nor relevant, given standard implant testing procedures.