Research data deposit for "Single atom chemical identification of TMD defects in ambient conditions"

Atomic Force Microscopy (AFM) Raw Data Supporting Figures 1–4 of "Single atom chemical identification of TMD defects in ambient conditions" Description This dataset contains raw Atomic Force Microscopy (AFM) scan files used to generate Figures 1–4 in the associated publication. The data were collected between February 2021 and March 2023 using AFM instrumentation. The files are primarily Bruker .spm scan files. Each file corresponds to the AFM scan used to generate a specific figure panel in the publication. The dataset provides the original scan data used to produce the height maps and line profiles shown in the figures. Where line profiles are referenced in the paper, these were extracted from the AFM scans using standard AFM analysis software. File formats .spm — Raw AFM scan data (Bruker format) The data can be opened and analysed using: Gwyddion Bruker NanoScope Analysis Other AFM analysis software supporting .spm files.Description