The Design of a Superchiral-Sensitive MCT Photodetector Based on Silicon Metasurfaces with Truncated Corners

The on-chip detection of circularly polarized light is pivotal for advancing applications in quantum optics, information processing, and spectroscopic sensing. However, conventional chiral metasurfaces often suffer from complex multilayer fabrication, material incompatibility, or modest performance, hindering their integration with photonic circuits. Here, we introduce a monolithic all-silicon metasurface that overcomes these limitations through a singular structural innovation. By strategically truncating four corners of a conventional Z-shaped meta-atom, we induce a hybridization of optical modes that profoundly enhances chiral light–matter interaction. This deliberately engineered perturbation yields a colossal circular dichroism with an extinction ratio exceeding 66 dB, a performance that surpasses existing state-of-the-art designs by approximately three orders of magnitude. Furthermore, the proposed metasurface exhibits remarkable fabrication robustness, owing to its single-layer architecture and CMOS-compatible material. We demonstrate that this exceptional metasurface can be directly integrated with a Mercury Cadmium Telluride (MCT) photodetector to form a highly efficient, compact circular polarization detector. Our work provides a simple yet powerful paradigm for creating high-performance chiral photonic devices, paving the way for their widespread adoption in integrated optoelectronics.