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Flexible X-ray detectors have emerged as a promising technology for portable medical imaging and wearable electronics, yet their manufacturing remains constrained by the competing requirements of device performance, mechanical conformability, and production scalability. Conventional solution-based deposition methods fail to yield high-quality perovskite thick films with uniform morphology, while vacuum evaporation techniques are limited by exorbitant operational costs and low throughput. Herein, we report an optimized solution-processed vacuum evaporation strategy that enables the fabrication of high-quality perovskite films (~1 μm thick) on flexible polyethylene naphthalate (PEN) substrates at a low processing temperature of 100 °C. By incorporating tailored additives into the precursor solution and precisely modulating the vapor-phase conversion kinetics, we achieved significant improvements in film density, crystallinity, and morphological uniformity. Systematic investigations were conducted to elucidate the structure–property relationships across three material systems: pure methylammonium lead iodide (MAPbI3), halogen-doped methylammonium lead iodide-bromide (MAPb(IBr)3), and synergistic cation-halogen engineered cesium-methylammonium lead iodide-bromide (CsMAPb(IBr)3). The optimized flexible PIN-type X-ray detector based on CsMAPb(IBr)3 exhibited exceptional performance metrics, including a dark current density as low as 5.2 nA cm−2 and an X-ray sensitivity of up to 1.43 × 104 μC·Gyair−1·cm−2. Remarkably, the device retained over 95% of its initial performance after 400 bending cycles with a bending radius of 6 mm, demonstrating outstanding mechanical robustness and operational durability. This work establishes a viable, cost-effective technical route for the scalable production of high-performance flexible X-ray detectors, addressing critical challenges in the advancement of next-generation portable imaging technologies.