Multiwavelength optical edge detection using GaAs/AlAs multilayer interference structures

We present a compact multilayer GaAs/AlAs structure designed for passive optical edge detection using angularly dependent interference effects. By precisely tuning refractive index contrast and layer thicknesses, the structure enhances high-spatial-frequency features while suppressing background intensity variations. Simulations and experimental results confirm a sharp reflectance transition, enabling high-contrast edge enhancement in optical imaging. Fabricated using molecular beam epitaxy (MBE), the device achieves high structural fidelity and operates across multiple wavelengths without additional modifications. This work introduces a real-time, hardware-based optical image processing technique with potential applications in advanced imaging and signal processing.