250 Gb/s All-Optical XNOR Logic Using a Single QD-SOA-MZI: Demonstration and Comprehensive Performance Analysis

Increasing data rates in optical networks require ultra-fast all-optical logic gates to avoid electro-optic conversion bottlenecks. This work presents a numerical simulation and performance analysis of an all-optical XNOR logic gate operating at 250 Gb/s, implemented using a single quantum-dot semiconductor optical amplifier (QD-SOA) embedded in a Mach–Zehnder interferometer (MZI). Using the QD-SOA’s ultrafast carrier dynamics and high nonlinearity, the gate achieves a quality factor (QF) of 26.30 at 250 Gb/s, corresponding to a theoretical bit-error rate below 10−9. A systematic numerical investigation examines performance dependence on six critical parameters. Data rate analysis shows that the gate maintains QF > 6 up to 700 Gb/s, with QF = 10.47 at this maximum reliable speed, providing a safety margin of approximately 1.8× above the QF = 6 threshold. Performance degrades progressively thereafter, with QF falling to 5.18 at 800 Gb/s and 0.73 at 1 Tb/s due to finite carrier recovery dynamics. Pulse energy optimization identifies an optimum at 0.20 pJ, beyond which gain saturation and nonlinear effects degrade performance below QF = 6 at 0.40 pJ. Continuous-wave probe power exhibits optimal operation at 0.40 mW, with failure above 0.80 mW. Injection current density analysis establishes an optimal bias at 4 kA/cm2, where balanced gain and nonlinearity yield peak performance. Noise tolerance assessment demonstrates operation up to a spontaneous emission factor of 6 and phase noise below 6 × 10−14 rad2/Hz, beyond which signal integrity collapses. This parameter sweep delineates the operational envelope and optimization guidelines for QD-SOA-MZI-based all-optical logic, confirming its potential as a compact core component for future ultra-high-speed optical communication and signal processing systems.