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C. K. Gary | Researchclopedia
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C. K. Gary
Adelphi Technology (United States)
ORCID
Top Works
X-ray Spectroscopy and Fluorescence Analysis
Advanced Electron Microscopy Techniques and Applications
X rays from relativistic electrons in a multilayer structure
Н. Н. Насонов
,
V. V. Kaplin
,
et al.
2003
40 citations