Researchclopedia

Research Researchers Institutions Topics Submit About

Command Palette

Search for a command to run...

Researchclopedia

Research Researchers Institutions About

© 2026 Researchclopedia. Powered by OpenAlex under CC0 license.

Okmetic (Finland) | Researchclopedia

Back to institutions

Okmetic (Finland)

Vantaacompany

129

Works

4,150

Citations

32

h-index

Top Research Topics

Silicon and Solar Cell Technologies Semiconductor materials and devices Silicon Carbide Semiconductor Technologies

Top Researchers

Marja‐Riitta Taskinen University of Helsinki

881 works111,054 citationsh-index: 128

Recent Research

A Detailed Examination of Polysilicon Resistivity Incorporating the Grain Size Distribution

Mikael Santonen,Antti Lahti,et al.

20254 citations

Advanced Surface Polishing Techniques

Thin-Film Transistor Technologies

3D IC and TSV technologies

Integrated Circuits and Semiconductor Failure Analysis

Advanced MEMS and NEMS Technologies

Semiconductor materials and interfaces

Advanced ceramic materials synthesis

Electronic Packaging and Soldering Technologies

GaN-based semiconductor devices and materials

Erik Janzén Kansas State University

831 works18,938 citationsh-index: 70

1,147 works7,960 citationsh-index: 37

Christopher Juhlin Uppsala University

531 works6,952 citationsh-index: 44

Rositsa Yakimova Linköping University

295 works6,678 citationsh-index: 44

Jouko Lahtinen Aalto University

163 works4,834 citationsh-index: 41

Modeling the Influence of Deposition Parameters on the Crystalline Degree in the Simulation of Polycrystalline Silicon

Mikael Santonen,Antti Lahti,et al.

20240 citations

Development and Characterization of PMUTs using Enchanced C-SOI Wafers

Cyril Baby Karuthedath,Abhilash Thanniyil Sebastian,et al.

20240 citations

Polycrystalline silicon, a molecular dynamics study: I. Deposition and growth modes

Mikael Santonen,Antti Lahti,et al.

20244 citations

Polycrystalline silicon, a molecular dynamics study: II. Grains, grain boundaries and their structure

Antti Lahti,Mikael Santonen,et al.

20246 citations

Detection of Microcracks in Cz‐Si Wafer Manufacturing by Photoluminescence Imaging

Katja Mustonen,Jukka‐Pekka Lähteenmäki,et al.

20241 citations