The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory

20084 citationsJournal Article

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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Published in: Microscopy and Microanalysis

Volume 14, Issue S2, pp. 1374-1375

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