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Electrical test prediction using hybrid metrology and machine learning
2017
17 citations
Journal Article
Field-Weighted Citation Impact:
0.73
Electrical test prediction using hybrid metrology and machine learning | Researchclopedia
Robin Chao
·
IBM (United States)
Gangadhara Raja Muthinti
·
IBM (United States)
Abraham Arceo de la Peña
·
IBM (United States)
Jacques Simon
·
IBM (United States)
Aron J. Ceplar
·
Nova Measuring Instruments (United States)
Matthew Sendelbach
·
Nova Measuring Instruments (United States)