Researchclopedia

Research Researchers Institutions Topics Submit About

Command Palette

Search for a command to run...

Researchclopedia

Research Researchers Institutions About

© 2026 Researchclopedia. Powered by OpenAlex under CC0 license.

Nova Measuring Instruments (Israel) | Researchclopedia

Back to institutions

Nova Measuring Instruments (Israel)

Rehovotcompany

112

Works

1,539

Citations

17

h-index

Top Research Topics

Advancements in Photolithography Techniques Optical Coatings and Gratings Integrated Circuits and Semiconductor Failure Analysis

Top Researchers

Oded Cohen Ben-Gurion University of the Negev

301 works12,080 citationsh-index: 40

Recent Research

" Understanding The Structure and Parameters Identification of Compliant Robot Arms Using Frequency Domain Analysis"

L. V. Gannel’

20240 citations

Industrial Vision Systems and Defect Detection

Surface Roughness and Optical Measurements

Advanced Surface Polishing Techniques

Semiconductor materials and devices

Copper Interconnects and Reliability

Advancements in Semiconductor Devices and Circuit Design

Advanced Measurement and Metrology Techniques

3D IC and TSV technologies

Electron and X-Ray Spectroscopy Techniques

Ami Schattner Hebrew University of Jerusalem

577 works6,196 citationsh-index: 40

Herzl Ben‐Hur Israel Institute for Biological Research

406 works4,068 citationsh-index: 22

Dani Hak Nova Measuring Instruments (Israel)

18 works2,807 citationsh-index: 9

71 works2,352 citationsh-index: 30

D. Shafir Nova Measuring Instruments (Israel)

34 works1,473 citationsh-index: 13

Scatterometry Application on Cu/SiCN Surface Topography Towards High Volume Manufacturing

Soon Aik Chew,Joey Hung,et al.

20240 citations

Unexpected improvement of resistant hypertension in older adults: A red flag sign

20241 citations

Wafer-scale characterization for two-dimensional material layers

Alain Moussa,Janusz Bogdanowicz,et al.

20241 citations

300 mm-wafer metrology for area-selective deposition in nanoscale patterns: A case study for ruthenium atomic layer deposition

Jan‐Willem J. Clerix,L. Warad,et al.

20235 citations

Process Control Challenges and Solutions for Advanced Semiconductor Devices

Yun Jung Jee,Sang Hyun Han,et al.

20231 citations