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Anton J. Bauer | Researchclopedia

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Anton J. Bauer

Fraunhofer Institute for Integrated Systems and Device Technology

322

Works

2,742

Citations

27

h-index

83

i10-index

Research Topics

Semiconductor materials and devices Silicon Carbide Semiconductor Technologies Advancements in Semiconductor Devices and Circuit Design

Affiliations

Austrian Academy of Sciences2015–2022

AMS (Austria)1993–1993

Schott (Germany)1995–2021

Friedrich-Alexander-Universität Erlangen-Nürnberg2009–2014

Bulgarian Academy of Sciences2008–2008

Top Works

Comprehensive Study of the Electron Scattering Mechanisms in 4H-SiC MOSFETs

Viktoryia Uhnevionak,A. Burenkov,et al.

201585 citations

Semiconductor materials and interfaces

Silicon and Solar Cell Technologies

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics

V. Yanev,Mathias Rommel,et al.

200885 citations

Different current conduction mechanisms through thin high-<i>k</i> HfxTiySizO films due to the varying Hf to Ti ratio

A. Paskaleva,Anton J. Bauer,et al.

200473 citations

Amorphous silicon carbide thin films (a-SiC:H) deposited by plasma-enhanced chemical vapor deposition as protective coatings for harsh environment applications

Werner Daves,A. Krauß,et al.

201171 citations

Detailed leakage current analysis of metal–insulator–metal capacitors with ZrO2, ZrO2/SiO2/ZrO2, and ZrO2/Al2O3/ZrO2 as dielectric and TiN electrodes

Wenke Weinreich,Shariq Ahmed,et al.

201268 citations

Impact of interface variations on J–V and C–V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1−)Al O2 films

Wenke Weinreich,R. Reiche,et al.

200963 citations

Structural properties of as deposited and annealed ZrO2 influenced by atomic layer deposition, substrate, and doping

Wenke Weinreich,L. Wilde,et al.

201255 citations

Hot electron transport in SiO2 probed with a scanning tunnel microscope

R. Ludeke,Anton J. Bauer,et al.

199552 citations

Reduced On Resistance in LDMOS Devices by Integrating Trench Gates Into Planar Technology

Tobias Erlbacher,Anton J. Bauer,et al.

201050 citations