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Anton J. Bauer | Researchclopedia
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Anton J. Bauer
Fraunhofer Institute for Integrated Systems and Device Technology
Top Works
Semiconductor materials and interfaces
Silicon and Solar Cell Technologies
Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics
V. Yanev
,
Mathias Rommel
,
et al.
2008
85 citations