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J. C. Woicik | Researchclopedia
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J. C. Woicik
Top Works
Electronic and Structural Properties of Oxides
Integrated Circuits and Semiconductor Failure Analysis
Dopant location identification in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msup><mml:mi mathvariant="normal">Nd</mml:mi><mml:mrow><mml:mn>3</mml:mn><mml:mo>+</mml:mo></mml:mrow></mml:msup></mml:math>-doped<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Ti</mml:mi><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>nanoparticles
W. Li
,
Anatoly I. Frenkel
,
et al.
2005
118 citations