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J. C. Woicik | Researchclopedia

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J. C. Woicik

26

Works

620

Citations

10

h-index

10

i10-index

Research Topics

Electron and X-Ray Spectroscopy Techniques Silicon and Solar Cell Technologies X-ray Spectroscopy and Fluorescence Analysis

Affiliations

National Institute of Standards and Technology1991–2020

Brookhaven National Laboratory1992–1992

University of Delaware2005–2005

Top Works

Direct Observation of Electrostatically Driven Band Gap Renormalization in a Degenerate Perovskite Transparent Conducting Oxide

Zachary W. Lebens-Higgins,David O. Scanlon,et al.

2016118 citations

Electronic and Structural Properties of Oxides

Integrated Circuits and Semiconductor Failure Analysis

Dopant location identification in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msup><mml:mi mathvariant="normal">Nd</mml:mi><mml:mrow><mml:mn>3</mml:mn><mml:mo>+</mml:mo></mml:mrow></mml:msup></mml:math>-doped<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Ti</mml:mi><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>nanoparticles

W. Li,Anatoly I. Frenkel,et al.

2005118 citations

Influence of oxygen vacancies on the electronic structure and magnetic properties of NiFe2O4 thin films

G. Hassnain Jaffari,Abdul K. Rumaiz,et al.

201298 citations

Gold-induced germanium crystallization

Zhengquan Tan,S. M. Heald,et al.

199278 citations

Anomalous lattice expansion of coherently strained<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mi>SrTiO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math>thin films grown on<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>Si</mml:mi><mml:mo>(</mml:mo><mml:mn>001</mml:mn><mml:mo>)</mml:mo></mml:mrow></mml:math>by kinetically controlled sequential deposition

J. C. Woicik,Hua Li,et al.

200666 citations

Determination of the Sb/Si(111) interfacial structure by back-reflection x-ray standing waves and surface extended x-ray-absorption fine structure

J. C. Woicik,T. Kendelewicz,et al.

199130 citations

Bond-length strain in buried Ga1−xInxAs thin-alloy films grown coherently on InP(001)

J. C. Woicik,J. A. Gupta,et al.

199824 citations

Nondestructive compositional depth profiling using variable‐kinetic energy hard X‐ray photoelectron spectroscopy and maximum entropy regularization

Conan Weiland,J. J. Krajewski,et al.

201412 citations

Site-specific X-ray photoelectron spectroscopy using X-ray standing waves

200511 citations