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Hans‐Ulrich Danzebrink | Researchclopedia

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Hans‐Ulrich Danzebrink

Physikalisch-Technische Bundesanstalt

66

Works

1,627

Citations

20

h-index

35

i10-index

Research Topics

Force Microscopy Techniques and Applications Advanced Measurement and Metrology Techniques Near-Field Optical Microscopy

Affiliations

Physikalisch-Technische Bundesanstalt1993–2025

Top Works

Metrological large range scanning probe microscope

Gaoliang Dai,Frank Pohlenz,et al.

2004150 citations

Integrated Circuits and Semiconductor Failure Analysis

Advanced Surface Polishing Techniques

Critical review of the current status of thickness measurements for ultrathin SiO <sub>2</sub> on Si Part V: Results of a CCQM pilot study

M. P. Seah,Steven J. Spencer,et al.

2004139 citations

Advances in Scanning Force Microscopy for Dimensional Metrology

Hans‐Ulrich Danzebrink,Ludger Koenders,et al.

2006137 citations

Accurate and traceable calibration of one-dimensional gratings

Gaoliang Dai,Ludger Koenders,et al.

2005110 citations

Accurate and traceable calibration of two-dimensional gratings

Gaoliang Dai,Frank Pohlenz,et al.

2007110 citations

The European nanometrology landscape

Richard Leach,Robert Boyd,et al.

201184 citations

Accurate and traceable measurement of nano- and microstructures

Gaoliang Dai,Frank Pohlenz,et al.

200675 citations

A high precision micro/nano CMM using piezoresistive tactile probes

Gaoliang Dai,Sebastian Bütefisch,et al.

200973 citations

A metrological large range atomic force microscope with improved performance

Gaoliang Dai,Helmut Wolff,et al.

200964 citations