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Yoshihiko Toyoda | Researchclopedia

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Yoshihiko Toyoda

24

Works

2,406

Citations

9

h-index

7

i10-index

Research Topics

Silicon Carbide Semiconductor Technologies Semiconductor materials and devices Copper Interconnects and Reliability

Affiliations

Panasonic (Japan)1986–1986

Mitsubishi Electric (Germany)2001–2013

Mitsubishi Electric (Japan)1992–2013

Mitsubishi Electric (United States)2014–2015

Osaka University1984–1987

Top Works

Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer

Hiroshi Amano,Nobuhiko Sawaki,et al.

19862,167 citations

Semiconductor materials and interfaces

Thin-Film Transistor Technologies

Stacking fault expansion from basal plane dislocations converted into threading edge dislocations in 4H-SiC epilayers under high current stress

Kazuya Konishi,S. Yamamoto,et al.

201367 citations

Photo-Induced Chemical Vapor Deposition of SiO<sub>2</sub> Film Using Direct Excitation Process by Deuterium Lamp

Masanori Okuyama,Yoshihiko Toyoda,et al.

198446 citations

Preparation of SiO<sub>2</sub>Film by Photo-Induced Chemical Vapor Deposition Using a Deuterium Lamp and Its Annealing Effect

Yoshihiko Toyoda,Kohji Inoue,et al.

198734 citations

Effect of Stacking Faults in Triangular Defects on 4H-SiC Junction Barrier Schottky Diodes

Kazuya Konishi,Shuhei Nakata,et al.

201320 citations

6.5-kV Full-SiC Power Module (HV100) with SBD-embedded SiC-MOSFETs

Junichi Nakashima,Akihisa Fukumoto,et al.

201815 citations

Driving Force of Stacking Fault Expansion in 4H-SiC PN Diode by <i>In Situ</i> Electroluminescence Imaging

Kazuya Konishi,S. Yamamoto,et al.

201413 citations

Demonstration of High Quality 4H-SiC Epitaxial Growth with Extremely Low Basal Plane Dislocation Density

Takanori Tanaka,Naoyuki Kawabata,et al.

20149 citations

Electromigration resistance of TiWN/Cu/TiWN interconnections

T. Fukada,Takeshi Mori,et al.

19959 citations